Researchers in China have developed an electrical imaging technique using three-dimensional (3D) tomographic conductive atomic force microscopy (TC-AFM) to go beyond indirect characterization of ...

Researchers at Oak Ridge National Laboratory have used specialized tools to study materials at the atomic scale and analyze ...

Atomic Force Microscopy (AFM) has evolved into a central technique in nanotechnology, providing three-dimensional imaging and precise measurements at the atomic scale. Its ability to probe surfaces by ...

Cecilia Van Cauwenberghe explains how to measure the future using nanoscale metrology and discusses the global competition ...

Atomic force microscopy (AFM) is a method of topographical measurement, wherein a fine probe is raster scanned over a material, and the minute variation in probe height is interpreted by laser ...

The study of biological systems varies from whole organisms, organs, and organoids, down to their building blocks of proteins and cells. At the lower end of the scale, atomic force microscope (AFM) ...

Invented 30 years ago, the atomic force microscope has been a major driver of nanotechnology, ranging from atomic-scale imaging to its latest applications in manipulating individual molecules, ...

Atomic force microscopy (AFM) is a way to investigate the surface features of some materials. It works by “feeling” or “touching” the surface with an extremely small probe. This provides a ...

An atomic force microscope tip writes data in stable ferroelectric structures, enabling reliable multistate storage at ...

A further development in atomic force microscopy now makes it possible to simultaneously image the height profile of nanometer-fine structures as well as the electric current and the frictional force ...

Researchers at IIT Delhi, with collaborators from Denmark and Germany, have developed AILA, an AI agent capable of ...